Neural Blind Deconvolution for Image Scanning Microscopy

概要

Image scanning microscopy (ISM) acquires one scanned image per detector element, which are then fused into a single image by multi-image deconvolution to obtain a super-resolved image. Its accuracy, however, depends on point spread function (PSF) models that sample- and system-induced aberrations often invalidate. Since differences between the scanned images encode aberration information, we propose a training-free blind Deep Image Prior (DIP) framework that jointly estimates the specimen and the detector-dependent PSFs. The PSFs are parametrised through the detector geometry and shared excitation and emission PSFs, reducing the unknowns while preserving the physical ISM model, and a Gaussian pre-initialisation stabilises the blind optimisation. On experimental tubulin data, blind DIP recovers finer filamentous structures than multi-image deconvolution and DIP with fixed theoretical PSFs, while adapting the PSFs to the measurements.

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# 論文・記事
Neural Blind Deconvolution for Image Scanning Microscopy

# 概要
Image scanning microscopy (ISM) acquires one scanned image per detector element, which are then fused into a single image by multi-image deconvolution to obtain a super-resolved image. Its accuracy,…

# 原典
https://arxiv.org/abs/2610.40088

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